Reliability and degradation : semiconductor devices and circuits
edited by M.J. Howes, D.V. Morgan (John Wiley and Sons, 1981)
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| Jenis Koleksi : | Buku Teks |
| No. Panggil : | 621.381 REL |
| Entri tambahan-Nama orang : | |
| Subjek : | |
| Penerbitan : | Chichester: John Wiley and Sons, 1981 |
| Sumber Pengatalogan: | |
| ISBN: | 0471280283 |
| Tipe Konten: | |
| Tipe Media: | |
| Tipe Carrier: | |
| Edisi: | First edition |
| Catatan Seri: | The Wiley series in solid state devices and circuits |
| Catatan Umum: | Includes bibliographical references and index |
| Catatan Versi Asli: | |
| Deskripsi Fisik: | xii, 444 p. : ill. ; 24 cm. |
| Lembaga Pemilik: | Universitas Indonesia |
| Lokasi: | Perpustakaan UI, Lantai 2 |
| No. Panggil | No. Barkod | Ketersediaan |
|---|---|---|
| 621.381 REL | 01-10-04011394 | TERSEDIA |
| Ulasan: |
| Tidak ada ulasan pada koleksi ini: 20360965 |
