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Atomic force microscopy based nanorobotics : modelling, simulation, setup building and experiments

Hui Xie (Springer, 2011)

 Abstrak

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.
There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature.

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Jenis Koleksi : eBooks
No. Panggil : e20418174
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Subjek :
Penerbitan : Berlin: Springer, 2011
Sumber Pengatalogan: LibUI eng rda
Tipe Konten: text
Tipe Media: computer
Tipe Pembawa: online resource
Deskripsi Fisik:
Tautan: http://www.springer.com/gp/book/9783642203282
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