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High quality test pattern generation and boolean satisfiability

Stephan Eggersgluß, Rolf Drechsler ([, Springer], 2012)

 Abstrak

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects.

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Jenis Koleksi : eBooks
No. Panggil : e20418663
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Subjek :
Penerbitan : New York: [, Springer], 2012
Sumber Pengatalogan: LibUI eng rda
Tipe Konten: text
Tipe Media: unmediated
Tipe Pembawa: online resource
Deskripsi Fisik:
Tautan: http://link.springer.com/book/10.1007%2F978-1-4419-9976-4
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