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ISTFATM 2007: proceedings of the 33rd international symposium for testing and failure analysis, November 4 - 8, 2007 San Jose McEnery Convention Center San Jose, California, USA

ASM International (ASM International, 2007)

 Abstrak

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.

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 Metadata

Jenis Koleksi : eBooks
No. Panggil : e20451916
Subjek :
Penerbitan : Materials Park, Ohio: ASM International, 2007
Sumber Pengatalogan: LibUI eng rda
Tipe Konten: text
Tipe Media: computer
Tipe Pembawa: online resources
Deskripsi Fisik: xvi, 344 pages : illustration
Tautan: http://portal.igpublish.com/iglibrary/search/?11
Lembaga Pemilik:
Lokasi:
  • Ketersediaan
  • Ulasan
  • Sampul
No. Panggil No. Barkod Ketersediaan
e20451916 02-17-119087180 TERSEDIA
Ulasan:
Tidak ada ulasan pada koleksi ini: 20451916
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