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Test generation of crosstalk delay faults in VLSI circuits

Jayanthy, S.; Bhuvaneswari, M.C. (Springer Singapore, 2019)

 Abstrak

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

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 Metadata

Jenis Koleksi : eBooks
No. Panggil : e20502693
Entri utama-Nama orang :
Entri tambahan-Nama orang :
Subjek :
Penerbitan : Singapore: Springer Singapore, 2019
Sumber Pengatalogan: LibUI eng rda
Tipe Konten: text
Tipe Media: computer
Tipe Pembawa: online resource
Deskripsi Fisik: xi, 156 pages : illustration
Tautan: http://link.springer.com/openurl?genre=book&isbn=978-981-13-2493-2
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No. Panggil No. Barkod Ketersediaan
e20502693 20-23-81606800 TERSEDIA
Ulasan:
Tidak ada ulasan pada koleksi ini: 9999920521535
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