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Ditemukan 11297 dokumen yang sesuai dengan query
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Billinton, Roy
New York: Plenum Press, 1983
620.004 52 BIL r
Buku Teks  Universitas Indonesia Library
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Dhillon, B.S. (Balbir S.), 1947-
New York: John Wiley & Sons, 1981
620.004 DHI e
Buku Teks  Universitas Indonesia Library
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Barlow, Richard E.
"Engineering reliability concerns failure data analysis, the economics of maintenance policies, and system reliability. This textbook develops the use of probability and statistics in engineering reliability and maintenance problems. The author uses probability models in the analysis of failure data, decision relative to planned maintenance, and prediction relative to preliminary design."
Philadelphia: American Management Association, 1998
e20448808
eBooks  Universitas Indonesia Library
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O`Connor, Patrick D.T.
Chichester: John Wiley & Sons, 1995
620.004 52 OCO p
Buku Teks  Universitas Indonesia Library
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Lewis, E.E. (Elmer Eugene), 1938-
New York: John Wiley & Sons, 1996
620.004 52 LEW i
Buku Teks  Universitas Indonesia Library
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McPherson, J.W.
"This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information contained within should help all fields of engineering to develop better methodologies for: more reliable product designs, more reliable materials selections, and more reliable manufacturing processes-all of which should help to improve product reliability. A mathematics level through differential equations is needed. Also, a familiarity with the use of excel spreadsheets is assumed. Any needed statistical training and tools are contained within the text. While device failure is a statistical process (thus making statistics important), the emphasis of this book is clearly on the physics of failure and developing the reliability engineering tools required for product improvements during device-design and device-fabrication phases.
- Provides a comprehensive textbook on reliability physics of semiconductors, from fundamentals to applications;
- Explains the fundamentals of reliability physics and engineering tools for building better products;
- Contains statistical training and tools within the text;
- Includes new chapters on Physics of Degradation, and Resonance and Resonance-Induced Degradation."
Switzerland: Springer Nature, 2019
e20509885
eBooks  Universitas Indonesia Library
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Villemeur, Alain
Chichester: John Wiley & Sons, 1991
620.004 52 VIL r
Buku Teks  Universitas Indonesia Library
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Lloyd, David K.
Englewood Cliffs, N.J.: Prentice-Hall, 1962
519 LLO r
Buku Teks  Universitas Indonesia Library
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Kapur, Kailash Chander
New York: John Wiley & Sons, 1977
620.004 2 KAP r
Buku Teks  Universitas Indonesia Library
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Bhote, Keki R.
"Companies following the Six Sigma process have seen their products' initial quality statistics soar, with defects all but eliminated. But how can companies make sure the quality lasts? One method is to subject products to exaggerated conditions that simulate the wear and tear of months, years, or a lifetime of use. Called Multiple Environment Overstress Tests (MEOST), these rigorous tests can expose potential design flaws, limitations of materials, and construction that normal quality inspections might miss. "World Class Reliability" presents a blueprint for creating and applying the MEOST methodology to products in almost any industry."
New York: American Management Association, 2004
e20438528
eBooks  Universitas Indonesia Library
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