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Bou-Sleiman, Sleiman, author

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result...

New York: [Springer, ], 2012

e20397989

eBooks  Universitas Indonesia Library

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