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Dahlang Tahir, author
Band alignment of ultrathin GIZO/SiO2/Si heterostructure determined by electron spectroscopy
ABSTRACT
Amorphous GaInZnO (GIZO) thin films are grown on Si02/Si substrate by the RF magnetron sputtering method. By the combination of measured band gaps from reflection energy loss spectroscopy (REELS) spectra and valence band from X-ray photo-electron spectroscopy (XPS) spectra, we have demonstrated the energy band alignment of GIZO thin films....
[Direktorat Riset dan Pengabdian Masyarakat UI;Universitas Hasanuddin. Departemen Fisika;Universitas Hasanuddin. Departemen Fisika, Universitas Hasanuddin. Departemen Fisika], 2011
J-Pdf
Artikel Jurnal  Universitas Indonesia Library