Ditemukan 1 dokumen yang sesuai dengan query
Eggersgluß, Stephan, author
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay...
New York: [, Springer], 2012
e20418663
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