Ditemukan 1 dokumen yang sesuai dengan query
Ming, He
In this book, the authors present the basic science underlying the thermal and electrical stability of metal-dielectric interfaces and its relationship to the operation of advanced interconnect systems in gigascale electronics. Interface phenomena, including chemical reactions between metals and dielectrics, metallic-atom diffusion, and ion drift, are discussed based on...
New York: Springer, 2012
e20401378
eBooks Universitas Indonesia Library
