Ditemukan 1 dokumen yang sesuai dengan query
Ruijing, Shen, author
This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and...
New York: [, Springer], 2012
e20418442
eBooks Universitas Indonesia Library
