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Hasil Pencarian

Ditemukan 3 dokumen yang sesuai dengan query
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Afshar, Amir
Principles of semiconductor network testing
Boston: Butterworth-Heinemann, 1995
621.381 548 AFS p
Buku Teks  Universitas Indonesia Library
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Schroder, Dieter K.
Semiconductor material and device characterization
New York: John Wiley & Sons, 1998
621.381 SCH s
Buku Teks  Universitas Indonesia Library
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Bogdanowicz, Janusz
Photomodulated optical reflectance : a fundamental study aimed at non-destructive carrier profiling in silicon
" One of the critical issues in semiconductor technology is the precise electrical characterization of ultra-shallow junctions. Among the plethora of measurement techniques, the optical reflectance approach developed in this work is the sole concept that does not require physical contact, making it suitable for non-invasive in-line metrology. This work develops extensively all the fundamental physical models of the photomodulated optical reflectance technique and introduces novel approaches that extend its applicability from dose monitoring towards detailed ... "
Berlin : Springer, 2012
e20424863
eBooks  Universitas Indonesia Library