Metal-dielectric interfaces in gigascale electronics: thermal and electrical stability
Ming He, Toh-Ming Lu (Springer, 2012)
|
In this book, the authors present the basic science underlying the thermal and electrical stability of metal-dielectric interfaces and its relationship to the operation of advanced interconnect systems in gigascale electronics. Interface phenomena, including chemical reactions between metals and dielectrics, metallic-atom diffusion, and ion drift, are discussed based on fundamental physical and chemical principles. Schematic diagrams are provided throughout the book to illustrate interface phenomena and the principles that govern them. |
![]()
|
No. Panggil : | e20401378 |
Entri utama-Nama orang : | |
Entri tambahan-Nama orang : | |
Subjek : | |
Penerbitan : | New York: Springer, 2012 |
Sumber Pengatalogan: | LibUI eng rda |
Tipe Konten: | text |
Tipe Media: | computer |
Tipe Pembawa: | online resource |
Deskripsi Fisik: | |
Tautan: | http://link.springer.com/book/10.1007%2F978-1-4614-1812-2 |
Lembaga Pemilik: | |
Lokasi: |
No. Panggil | No. Barkod | Ketersediaan |
---|---|---|
e20401378 | TERSEDIA |
Ulasan: |
Tidak ada ulasan pada koleksi ini: 20401378 |