Kelvin probe force microscopy : measuring and compensating electrostatic forces
Sascha Sadewasser, Thilo Glatzel (Springer, 2012)
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| This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. |
 Kelvin Probe Force Microscopy.pdf :: Unduh
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| No. Panggil : | e20405909 |
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| Penerbitan : | Berlin: Springer, 2012 |
| Sumber Pengatalogan: | LibUI eng rda |
| Tipe Konten: | text |
| Tipe Media: | computer |
| Tipe Pembawa: | online resource |
| Deskripsi Fisik: | |
| Tautan: | http://link.springer.com/book/10.1007%2F978-3-642-22566-6 |
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| No. Panggil | No. Barkod | Ketersediaan |
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| e20405909 | TERSEDIA |
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| Tidak ada ulasan pada koleksi ini: 20405909 |
