Test and diagnosis for small-delay defects
Mohammad Tehranipoor (Springer, 2011)
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| This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise. |
 Test and Diagnosis for Small-Delay Defects, Mohammad Tehranipoor, Ke Peng Krishnendu Chakrabarty 2012.pdf :: Unduh
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| No. Panggil : | e20410831 |
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| Penerbitan : | New York: Springer, 2011 |
| Sumber Pengatalogan: | LibUI eng rda |
| Tipe Konten: | text |
| Tipe Media: | computer |
| Tipe Pembawa: | online resource |
| Deskripsi Fisik: | |
| Tautan: | http://link.springer.com/book/10.1007%2F978-1-4419-8297-1 |
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| No. Panggil | No. Barkod | Ketersediaan |
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| e20410831 | TERSEDIA |
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| Tidak ada ulasan pada koleksi ini: 20410831 |
