Full Description
| Responsibility Statement | Hui Xie |
| Language Code | eng |
| Edition | |
| Collection Source | e-Book BOPTN 2013 |
| Cataloguing Source | LibUI eng rda |
| Content Type | text (rdacontent) |
| Media Type | computer (rdamedia) |
| Carrier Type | online resource (rdacarrier) |
| Physical Description | |
| Link | http://www.springer.com/gp/book/9783642203282 |
- Availability
- Digital Files: 1
- Review
- Cover
- Abstract
| Call Number | Barcode Number | Availability |
|---|---|---|
| e20418174 | TERSEDIA |
| No review available for this collection: 20418174 |
Abstract
The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.
There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature.