Atomic force microscopy based nanorobotics : modelling, simulation, setup building and experiments
Hui Xie (Springer, 2011)
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| The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.There have been many progress on modeling, imaging, teleoperated or automated control, human-machine interfacing, instrumentation, and applications of AFM based nanorobotic manipulation systems in literature. |
 Atomic Force Microscopy Based Nanorobotics.pdf :: Unduh
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| No. Panggil : | e20418174 |
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| Penerbitan : | Berlin: Springer, 2011 |
| Sumber Pengatalogan: | LibUI eng rda |
| Tipe Konten: | text |
| Tipe Media: | computer |
| Tipe Pembawa: | online resource |
| Deskripsi Fisik: | |
| Tautan: | http://www.springer.com/gp/book/9783642203282 |
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| No. Panggil | No. Barkod | Ketersediaan |
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| e20418174 | TERSEDIA |
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