:: eBooks :: Kembali

eBooks :: Kembali

Statistical performance analysis and modeling techniques for nanometer VLSI designs

Ruijing Shen, Sheldon X.-D. Tan, Hao Yu ([, Springer], 2012)

 Abstrak

This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits.

 File Digital: 1

Shelf
 Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs.pdf :: Unduh

LOGIN required

 Metadata

No. Panggil : e20418442
Entri utama-Nama orang :
Entri tambahan-Nama orang :
Subjek :
Penerbitan : New York: [, Springer], 2012
Sumber Pengatalogan: LibUI eng rda
Tipe Konten: text
Tipe Media: computer
Tipe Pembawa: online resource
Deskripsi Fisik:
Tautan: http://link.springer.com/book/10.1007%2F978-1-4614-0788-1
Lembaga Pemilik:
Lokasi:
  • Ketersediaan
  • Ulasan
No. Panggil No. Barkod Ketersediaan
e20418442 TERSEDIA
Ulasan:
Tidak ada ulasan pada koleksi ini: 20418442