Statistical performance analysis and modeling techniques for nanometer VLSI designs
Ruijing Shen, Sheldon X.-D. Tan, Hao Yu ([, Springer], 2012)
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| This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. |
 Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs.pdf :: Unduh
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| No. Panggil : | e20418442 |
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| Penerbitan : | New York: [, Springer], 2012 |
| Sumber Pengatalogan: | LibUI eng rda |
| Tipe Konten: | text |
| Tipe Media: | computer |
| Tipe Pembawa: | online resource |
| Deskripsi Fisik: | |
| Tautan: | http://link.springer.com/book/10.1007%2F978-1-4614-0788-1 |
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| No. Panggil | No. Barkod | Ketersediaan |
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| e20418442 | TERSEDIA |
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| Tidak ada ulasan pada koleksi ini: 20418442 |
