High quality test pattern generation and boolean satisfiability
Stephan Eggersgluß, Rolf Drechsler ([, Springer], 2012)
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| This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects. |
 High Quality Test Pattern Generation and Boolean Satisfiability.pdf :: Unduh
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| No. Panggil : | e20418663 |
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| Penerbitan : | New York: [, Springer], 2012 |
| Sumber Pengatalogan: | LibUI eng rda |
| Tipe Konten: | text |
| Tipe Media: | unmediated |
| Tipe Pembawa: | online resource |
| Deskripsi Fisik: | |
| Tautan: | http://link.springer.com/book/10.1007%2F978-1-4419-9976-4 |
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| No. Panggil | No. Barkod | Ketersediaan |
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| e20418663 | TERSEDIA |
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