ISTFA 2010: conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA
ASM International (ASM International, 2010)
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| This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results. |
 ISTFA� 2010 proceedings of the 36th International symposium for testing and failure analysis.pdf :: Unduh
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| No. Panggil : | e20451716 |
| Subjek : | |
| Penerbitan : | Materials Park, Ohio: ASM International, 2010 |
| Sumber Pengatalogan: | LibUI eng rda |
| Tipe Konten: | text |
| Tipe Media: | computer |
| Tipe Pembawa: | online resources |
| Deskripsi Fisik: | xix, 450 pages : illustration |
| Tautan: | http://portal.igpublish.com/iglibrary/search/ASMIB0000134.main.html?16 |
| Lembaga Pemilik: | |
| Lokasi: |
| No. Panggil | No. Barkod | Ketersediaan |
|---|---|---|
| e20451716 | 02-17-012705981 | TERSEDIA |
| Ulasan: |
| Tidak ada ulasan pada koleksi ini: 20451716 |
