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ISTFA 2010: conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA

ASM International (ASM International, 2010)

 Abstrak

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.

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 Metadata

No. Panggil : e20451716
Subjek :
Penerbitan : Materials Park, Ohio: ASM International, 2010
Sumber Pengatalogan: LibUI eng rda
Tipe Konten: text
Tipe Media: computer
Tipe Pembawa: online resources
Deskripsi Fisik: xix, 450 pages : illustration
Tautan: http://portal.igpublish.com/iglibrary/search/ASMIB0000134.main.html?16
Lembaga Pemilik:
Lokasi:
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No. Panggil No. Barkod Ketersediaan
e20451716 02-17-012705981 TERSEDIA
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