ISTFATM 2006: proceedings of the 32nd international symposium for testing and failure analysis, November 12-16, 2006 Renaissance Austin Hotel Austin, Texas, USA
ASM International (ASM International, 2006)
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| This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand and eliminate electronic device and system failures. |
 ISTFATM 2006 proceedings of the 32nd international symposium for testing and failure analysis, November 12�16, 2006 renaissance austin hotel austin, texas, USA.pdf :: Unduh
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| No. Panggil : | e20451852 |
| Subjek : | |
| Penerbitan : | Materials Park, Ohio: ASM International, 2006 |
| Sumber Pengatalogan: | LibUI eng rda |
| Tipe Konten: | text |
| Tipe Media: | computer |
| Tipe Pembawa: | online resource |
| Deskripsi Fisik: | xx, 524 pages : illustration |
| Tautan: | http://portal.igpublish.com/iglibrary/search/ASMIB0000102.main.html?14 |
| Lembaga Pemilik: | |
| Lokasi: |
| No. Panggil | No. Barkod | Ketersediaan |
|---|---|---|
| e20451852 | 02-17-664807552 | TERSEDIA |
| Ulasan: |
| Tidak ada ulasan pada koleksi ini: 20451852 |
