Full Description

Responsibility Statement	ASM International
Language Code	eng
Edition
Collection Source	IG Publishing/IG Library
Cataloguing Source	LibUI eng rda
Content Type	text (rdacontent)
Media Type	computer (rdamedia)
Carrier Type	online resources (rdacarrier)
Physical Description	xvi, 344 pages : illustration
Link	http://portal.igpublish.com/iglibrary/search/?11

Availability
Digital Files: 1
Review
Cover
Abstract

Call Number	Barcode Number	Availability
e20451916	02-17-119087180	TERSEDIA

ISTFATM 2007 proceedings of the 33rd international symposium for testing and failure analysis, November 4 ? 8, 2007 San Jos? McEnery convention center San Jos?, California, USA.pdf

No review available for this collection: 20451916

Abstract

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.