Test generation of crosstalk delay faults in VLSI circuits
Jayanthy, S.;
Bhuvaneswari, M.C.
(Springer Singapore, 2019)
|
| This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing. |
 Test Generation of Crosstalk Delay Faults in VLSI Circuits.pdf :: Unduh
|
| No. Panggil : | e20502693 |
| Entri utama-Nama orang : | |
| Entri tambahan-Nama orang : | |
| Subjek : | |
| Penerbitan : | Singapore: Springer Singapore, 2019 |
| Sumber Pengatalogan: | LibUI eng rda |
| Tipe Konten: | text |
| Tipe Media: | computer |
| Tipe Pembawa: | online resource |
| Deskripsi Fisik: | xi, 156 pages : illustration |
| Tautan: | |
| Lembaga Pemilik: | |
| Lokasi: |
| No. Panggil | No. Barkod | Ketersediaan |
|---|---|---|
| e20502693 | 20-23-81606800 | TERSEDIA |
| Ulasan: |
| Tidak ada ulasan pada koleksi ini: 9999920521535 |
