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Physics of strongly-coupled dopant-atoms in nanodevices

Krzysztof Tyszka, Yuki Takasu, Arup Samanta, Takeshi Mizuno, Ryszard Jablonski, Michiharu Tabe (Faculty of Engineering, Universitas Indonesia, 2015)

 Abstrak

In silicon nanoscale transistors, dopant atoms can significantly affect the transport characteristics, in particular at low temperatures. Investigation of coupling between neighboring dopants in such devices is essential in defining the properties for transport. In this work, we present an overview of different regimes of inter-dopant coupling, controlled by doping concentration and a selective doping process. Tunneling-transport spectroscopy can reveal the fundamental physics of isolated dopants in comparison with strongly-coupled dopants. In addition, observations of surface potential for Si nano-transistors can provide direct access to understanding the behavior of coupled dopants.

 Metadata

No. Panggil : UI-IJTECH 6:6 (2015)
Entri utama-Nama orang :
Subjek :
Penerbitan : Depok: Faculty of Engineering, Universitas Indonesia, 2015
Sumber Pengatalogan : LibUI eng rda
ISSN : 20869614
Majalah/Jurnal : International Journal of Technology
Volume : Vol. 6, No. 6, December 2015: Hal. 1057-1064
Tipe Konten : text
Tipe Media : unmediated
Tipe Carrier : volume
Akses Elektronik : https://doi.org/10.14716/ijtech.v6i6.1305
Institusi Pemilik : Universitas Indonesia
Lokasi : Perpustakaan UI, Lantai 4 R. Koleksi Jurnal
  • Ketersediaan
  • Ulasan
No. Panggil No. Barkod Ketersediaan
UI-IJTECH 6:6 (2015) 08-23-50284438 TERSEDIA
Ulasan:
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