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Loretto, M.H.,author

New York: Chapman & Hall, 1994

620.112 LOR e

Buku Teks  Universitas Indonesia Library

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Schiller, Siegfred, author

New York: John Wiley & Sons, 1982

621.381 SCH e

Buku Teks  Universitas Indonesia Library

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Orlando: Academic Press, 1984

570.72 OPT

Buku Teks  Universitas Indonesia Library

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This book presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain...

New York: Springer, 2012

e20405933

eBooks  Universitas Indonesia Library

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