Ditemukan 30 dokumen yang sesuai dengan query
New York: McGraw-Hill, 1994
621.381 ELE
Buku Teks Universitas Indonesia Library
Buku yang berjudul "Electronic materials handbook : volume 1 packaging" ini merupakan sebuah buku panduan mengenai material elektronik...
[Place of publication not identified]: ASM International, 1989
R 621.381 ELE I
Buku Referensi Universitas Indonesia Library
Contents :
- A Comparitive Study of Electron and Ion Beam Induced Charge Imaging
Techniques in CMOS Failure Analysis
- Infrared Light Emission From Semiconductor Devices
- The Use of Near-Field Scanning Optical Microscopy for Failure Analysis of ULSI
Circuits
-...
Materials Park, Ohio: ASM International, 1996
e20442490
eBooks Universitas Indonesia Library
McKinley, Arnold, author
This book develops the analytical theory of perfectly conducting and lossy metal, circular, round-wire loop antennas and nano-scaled rings from the radio frequency (RF) regime through infrared and the optical region. It does so from an antenna theory perspective. It is the first time that all of the historical material...
Singapore: Springer Nature, 2019
e20509628
eBooks Universitas Indonesia Library
Contents :
- Foreword
- The Microelectronics Desk Reference
- System Level Failure Analysis Process: Making Failure Analysis a Value Add
Proposition in today’s High Speed Low Cost PC environment
- Board Level Failure Mechanisms and Analysis in Hand-held Electronic Products
- Failure Analysis Flow...
Materials Park, Ohio: ASM International, 2004
e20442591
eBooks Universitas Indonesia Library
Contents :
- Microelectronics failure analysis desk reference, 2001 supplement
- Preface
- Microelectronic Failure Analysis Desk Reference 2001 Supplement
- FIB Backside Isolation Techniques
- The SEM Lab, From Laboratory Logistics to Final Sample Preparation
Techniques for SEM Analysis of Semiconductors
- Cross...
Materials Park, Ohio: ASM International, 2001
e20442592
eBooks Universitas Indonesia Library
Contents
- IPFA 2000 Best Paper Award Winner
- Application of Focused Ion Beam System as a Defect Localization and Root
Cause Analysis Tool
- Session 1: Advanced Techniques 1
- X-Ray Tomography of Integrated Circuit Interconnects: Past and Future
- X-ray Nanotomog...
Materials Park, Ohio: ASM International, 2001
e20442603
eBooks Universitas Indonesia Library
Contents :
- Foreword
- The Microelectronics Desk Reference
- System Level Failure Analysis Process: Making Failure Analysis a Value Add
Proposition in today’s High Speed Low Cost PC environment
- Board Level Failure Mechanisms and Analysis in Hand-held Electronic Products
- Failure Analysis...
Materials Park, Ohio: ASM International, 2004
e20442620
eBooks Universitas Indonesia Library
Contents :
- Session 1: Advanced Techniques
- Scanning Magnetoresistive Microscopy for Die-Level Sub-Micron Current Density
Mapping
- High Resolution Current Imaging by Direct Magnetic Field Sensing
- Fault Isolation of High Resistance Defects using Comparative Magnetic Field
Imaging
- High Resolution Backside...
Materials Park, Ohio: ASM International, 2003
e20442631
eBooks Universitas Indonesia Library
Contents :
- Microscopy at the Nanoscale
- Polarization Difference Probing: A New Phase Detection Scheme for Laser
Voltage Probing
- Spray Cooling for Time Resolved Emission Measurements of ICs
- A Novel Technique for Detecting High Resistance Fault Using Electroplating
- Magnetic Current Imaging...
Materials Park, Ohio: ASM International, 2004
e20442635
eBooks Universitas Indonesia Library
