Ditemukan 44 dokumen yang sesuai dengan query
Contents
- IPFA 2000 Best Paper Award Winner
- Application of Focused Ion Beam System as a Defect Localization and Root
Cause Analysis Tool
- Session 1: Advanced Techniques 1
- X-Ray Tomography of Integrated Circuit Interconnects: Past and Future
- X-ray Nanotomog...
Materials Park, Ohio: ASM International, 2001
e20442603
eBooks Universitas Indonesia Library
Contents :
- Foreword
- The Microelectronics Desk Reference
- System Level Failure Analysis Process: Making Failure Analysis a Value Add
Proposition in today’s High Speed Low Cost PC environment
- Board Level Failure Mechanisms and Analysis in Hand-held Electronic Products
- Failure Analysis...
Materials Park, Ohio: ASM International, 2004
e20442620
eBooks Universitas Indonesia Library
Contents :
- Session 1: Advanced Techniques
- Scanning Magnetoresistive Microscopy for Die-Level Sub-Micron Current Density
Mapping
- High Resolution Current Imaging by Direct Magnetic Field Sensing
- Fault Isolation of High Resistance Defects using Comparative Magnetic Field
Imaging
- High Resolution Backside...
Materials Park, Ohio: ASM International, 2003
e20442631
eBooks Universitas Indonesia Library
Contents :
- Microscopy at the Nanoscale
- Polarization Difference Probing: A New Phase Detection Scheme for Laser
Voltage Probing
- Spray Cooling for Time Resolved Emission Measurements of ICs
- A Novel Technique for Detecting High Resistance Fault Using Electroplating
- Magnetic Current Imaging...
Materials Park, Ohio: ASM International, 2004
e20442635
eBooks Universitas Indonesia Library
