Ditemukan 347 dokumen yang sesuai dengan query
CONTENTS :
- CONFERENCE MANAGEMENT
- FOREWORD
- PROGRAM OF THE FOURTEENTH NATIONAL ELECTRONICS CONFERENCE
- GENERAL PAPERS
- THE DAWN OF ELECTRONICS
- SPACE OR ELECTRONICS WHICH WILL DOMINATE THE CENTURY?
- TECHNICAL PAPERS
- TURN ON DELAY TIME AND ITS...
Chicago: National Electronics Conference, 1959
e20448446
eBooks Universitas Indonesia Library
CONTENTS :
- CONFERENCE MANAGEMENT
- FOREWORD
- PROGRAM OF THE FIFTEENTH NATIONAL ELECTRONICS CONFERENCE
- N. E. C. Award
- TECHNICAL PAPERS
- TRENDS IN ADAPTIVE CONTROL SYSTEMS
- MULTIDIMENSIONAL ADAPTIVE CONTROL
- ON THE PHILOSOPHY OF ADAPTIVE CONTROL FOR PLANT ADAPTIVE...
Chicago: National Electronics Conference, 1960
e20448452
eBooks Universitas Indonesia Library
CONTENTS :
- CONFERENCE MANAGEMENT
- FOREWOBD
- PROGRAM OF THE SIXTEENTH NATIONAL ELECTRONICS CONFERENCE
- AWARDS
- TECHNICAL PAPERS
- THE NEW MASS COMMUNICATIONS
- MODULATION AND SIGNAL SELECTION FOR DIGITAL DATA SYSTEMS
- BINARY CODES FOR ERROR CONTROL
- NOTES ON...
National Electronics Conference,
e20448454
eBooks Universitas Indonesia Library
CONTENTS :
- CONFERENCE MANAGEMENT
- PRESIDENT'S MESSAGE
- PROGRAM OF THE SEVENTEENTH NATIONAL ELECTRONICS
CONFERENCE
- A HIGH SPEED TELEPRINTING SYSTEM
- COMMUNICATIONS CENTRAL SYSTEM, AN/MRC-66
- NONLINEAR RESISTANCE FOR MICROELECTRONICS
- TITANIUM THIN FIIM CIRCUITS
- DESIGN PROCEDURE FOR FILM...
Chicago: National Electronics Conference, 1961
e20448459
eBooks Universitas Indonesia Library
CONTENTS:
- GENERAL INDEX OF TECHNICAL PAPERS
- INDEX OF TECHNICAL PAPERS BY SESSION
- PROGRAM OF THE 19TH NATIONAL ELECTRONICS CONFERENCE
- TUESDAY AFTERNOON, OCTOBER 29
- President's Message
- CONFERENCE MANAGEMENT
- N. E. C. Fellowship Awards
- TECHNICAL PAPERS ...
Chicago: National Electronics Conference, 1963
e20448460
eBooks Universitas Indonesia Library
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and...
Materials Park, Ohio: ASM International, 2010
e20451716
eBooks Universitas Indonesia Library
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and...
Materials Park, Ohio: ASM International, 2007
e20451916
eBooks Universitas Indonesia Library
Givone, Donald D., author
Dubuque : McGraw-Hill, 2003
621GIVD003
Multimedia Universitas Indonesia Library
London: Chapman & Hall, 2018
537 JMS
Majalah, Jurnal, Buletin Universitas Indonesia Library
Ryan, Ray
New York : Glencoe Division, Macmillan/McGraw-Hill, 1993
621.381 RYA d
Buku Teks Universitas Indonesia Library
