Ditemukan 348 dokumen yang sesuai dengan query
Contents :
- Foreword
- The Microelectronics Desk Reference
- System Level Failure Analysis Process: Making Failure Analysis a Value Add
Proposition in today’s High Speed Low Cost PC environment
- Board Level Failure Mechanisms and Analysis in Hand-held Electronic Products
- Failure Analysis Flow...
Materials Park, Ohio: ASM International, 2004
e20442591
eBooks Universitas Indonesia Library
Contents :
- Microelectronics failure analysis desk reference, 2001 supplement
- Preface
- Microelectronic Failure Analysis Desk Reference 2001 Supplement
- FIB Backside Isolation Techniques
- The SEM Lab, From Laboratory Logistics to Final Sample Preparation
Techniques for SEM Analysis of Semiconductors
- Cross...
Materials Park, Ohio: ASM International, 2001
e20442592
eBooks Universitas Indonesia Library
Contents
- IPFA 2000 Best Paper Award Winner
- Application of Focused Ion Beam System as a Defect Localization and Root
Cause Analysis Tool
- Session 1: Advanced Techniques 1
- X-Ray Tomography of Integrated Circuit Interconnects: Past and Future
- X-ray Nanotomog...
Materials Park, Ohio: ASM International, 2001
e20442603
eBooks Universitas Indonesia Library
Contents :
- Foreword
- The Microelectronics Desk Reference
- System Level Failure Analysis Process: Making Failure Analysis a Value Add
Proposition in today’s High Speed Low Cost PC environment
- Board Level Failure Mechanisms and Analysis in Hand-held Electronic Products
- Failure Analysis...
Materials Park, Ohio: ASM International, 2004
e20442620
eBooks Universitas Indonesia Library
Contents :
- IPFA 2002 Best Paper Award Winner
- SEM/SThM-Hybrid-System: A New Tool for Advanced Thermal Analysis of
Electronic Devices
- From Microns to Molecules–Can FA Remain Viable Through the Next Decade?
- Soft Defect Localization (SDL) on ICs
- Fault Localization and Functional...
Materials Park, Ohio: ASM International, 2002
e20442621
eBooks Universitas Indonesia Library
Contents :
- Session 1: Advanced Techniques
- Scanning Magnetoresistive Microscopy for Die-Level Sub-Micron Current Density
Mapping
- High Resolution Current Imaging by Direct Magnetic Field Sensing
- Fault Isolation of High Resistance Defects using Comparative Magnetic Field
Imaging
- High Resolution Backside...
Materials Park, Ohio: ASM International, 2003
e20442631
eBooks Universitas Indonesia Library
Contents :
- Microscopy at the Nanoscale
- Polarization Difference Probing: A New Phase Detection Scheme for Laser
Voltage Probing
- Spray Cooling for Time Resolved Emission Measurements of ICs
- A Novel Technique for Detecting High Resistance Fault Using Electroplating
- Magnetic Current Imaging...
Materials Park, Ohio: ASM International, 2004
e20442635
eBooks Universitas Indonesia Library
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand and eliminate electronic device and system failures...
Materials Park, Ohio: ASM International, 2006
e20451852
eBooks Universitas Indonesia Library
Crisnova Arnas Clara, author
Budaya perusahaan memegang peran penting dalam keberlangsungan suatu perusahaan karena melandasi nilai-nilai budaya dan serangkaian peraturan yang dipegang bersama sebagai pedoman bagi anggota perusahaan dalam bertindak dan berperilaku. Nilai-nilai budaya perusahaan yang dianut Samsung Electronic Indonesia (SEIN) telah membuktikan bahwa penerapan nilai-nilai Konfusianisme Korea, seperti hubungan subordinat dan loyalitas, di...
Depok: Fakultas Ilmu Pengetahuan dan Budaya Universitas Indonesia, 2020
MK-Pdf
UI - Makalah dan Kertas Kerja Universitas Indonesia Library
Jakarta: University Indonesia, 2003
621STUI001
Multimedia Universitas Indonesia Library
