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Hasil Pencarian

 
Ditemukan 3 dokumen yang sesuai dengan query
cover
Healy, James T., author
Automatic testing and evaluation of digital integrated circuits
Reston, Virginia: Reston Publishing, 1981
621.381 73 HEA a
Buku Teks  Universitas Indonesia Library
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Abramovici, Miron
Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
New Jersey : John Wiley & Sons, 1990
621.392 ABR d
Buku Teks  Universitas Indonesia Library
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Lala, Parag K.
Digital circuit testing and testability / Parag K. Lala
New York: Academic Press , 1997
621.39 LAL d
Buku Teks  Universitas Indonesia Library