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Hasil Pencarian

 
Ditemukan 8 dokumen yang sesuai dengan query
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Lenk, John D., author
Handbook of electronic test procedures
New Jersey: Prentice-Hall, 1982
R 621.381 LEN h
Buku Referensi  Universitas Indonesia Library
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Lenk, John D., author
McGraw-Hill electronic testing handbook: procedures and techniques
New York: McGraw-Hill, 1993
R 621.38 LEN m
Buku Referensi  Universitas Indonesia Library
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Microelectronics failure analysis: desk reference
Contents : - Foreword - The Microelectronics Desk Reference - System Level Failure Analysis Process: Making Failure Analysis a Value Add Proposition in today’s High Speed Low Cost PC environment - Board Level Failure Mechanisms and Analysis in Hand-held Electronic Products - Failure Analysis Flow...
Materials Park, Ohio: ASM International, 2004
e20442591
eBooks  Universitas Indonesia Library
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Microelectronic failure analysis: desk reference, 2001 supplement
Contents : - Microelectronics failure analysis desk reference, 2001 supplement - Preface - Microelectronic Failure Analysis Desk Reference 2001 Supplement - FIB Backside Isolation Techniques - The SEM Lab, From Laboratory Logistics to Final Sample Preparation Techniques for SEM Analysis of Semiconductors - Cross...
Materials Park, Ohio: ASM International, 2001
e20442592
eBooks  Universitas Indonesia Library
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ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis: 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California
Contents - IPFA 2000 Best Paper Award Winner - Application of Focused Ion Beam System as a Defect Localization and Root Cause Analysis Tool - Session 1: Advanced Techniques 1 - X-Ray Tomography of Integrated Circuit Interconnects: Past and Future - X-ray Nanotomog...
Materials Park, Ohio: ASM International, 2001
e20442603
eBooks  Universitas Indonesia Library
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Microelectronic failure analysis: desk reference
Contents : - Foreword - The Microelectronics Desk Reference - System Level Failure Analysis Process: Making Failure Analysis a Value Add Proposition in today’s High Speed Low Cost PC environment - Board Level Failure Mechanisms and Analysis in Hand-held Electronic Products - Failure Analysis...
Materials Park, Ohio: ASM International, 2004
e20442620
eBooks  Universitas Indonesia Library
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ISTFA 2003: Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara, California
Contents : - Session 1: Advanced Techniques - Scanning Magnetoresistive Microscopy for Die-Level Sub-Micron Current Density Mapping - High Resolution Current Imaging by Direct Magnetic Field Sensing - Fault Isolation of High Resistance Defects using Comparative Magnetic Field Imaging - High Resolution Backside...
Materials Park, Ohio: ASM International, 2003
e20442631
eBooks  Universitas Indonesia Library
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ISTFATM 2004: proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts
Contents : - Microscopy at the Nanoscale - Polarization Difference Probing: A New Phase Detection Scheme for Laser Voltage Probing - Spray Cooling for Time Resolved Emission Measurements of ICs - A Novel Technique for Detecting High Resistance Fault Using Electroplating - Magnetic Current Imaging...
Materials Park, Ohio: ASM International, 2004
e20442635
eBooks  Universitas Indonesia Library