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Hasil Pencarian

 
Ditemukan 6 dokumen yang sesuai dengan query
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Contents : - Foreword - The Microelectronics Desk Reference - System Level Failure Analysis Process: Making Failure Analysis a Value Add Proposition in today’s High Speed Low Cost PC environment - Board Level Failure Mechanisms and Analysis in Hand-held Electronic Products - Failure Analysis Flow...
Materials Park, Ohio: ASM International, 2004
e20442591
eBooks  Universitas Indonesia Library
cover
Contents : - Microelectronics failure analysis desk reference, 2001 supplement - Preface - Microelectronic Failure Analysis Desk Reference 2001 Supplement - FIB Backside Isolation Techniques - The SEM Lab, From Laboratory Logistics to Final Sample Preparation Techniques for SEM Analysis of Semiconductors - Cross...
Materials Park, Ohio: ASM International, 2001
e20442592
eBooks  Universitas Indonesia Library
cover
Contents - IPFA 2000 Best Paper Award Winner - Application of Focused Ion Beam System as a Defect Localization and Root Cause Analysis Tool - Session 1: Advanced Techniques 1 - X-Ray Tomography of Integrated Circuit Interconnects: Past and Future - X-ray Nanotomog...
Materials Park, Ohio: ASM International, 2001
e20442603
eBooks  Universitas Indonesia Library
cover
Contents : - Foreword - The Microelectronics Desk Reference - System Level Failure Analysis Process: Making Failure Analysis a Value Add Proposition in today’s High Speed Low Cost PC environment - Board Level Failure Mechanisms and Analysis in Hand-held Electronic Products - Failure Analysis...
Materials Park, Ohio: ASM International, 2004
e20442620
eBooks  Universitas Indonesia Library
cover
Contents : - Session 1: Advanced Techniques - Scanning Magnetoresistive Microscopy for Die-Level Sub-Micron Current Density Mapping - High Resolution Current Imaging by Direct Magnetic Field Sensing - Fault Isolation of High Resistance Defects using Comparative Magnetic Field Imaging - High Resolution Backside...
Materials Park, Ohio: ASM International, 2003
e20442631
eBooks  Universitas Indonesia Library
cover
Contents : - Microscopy at the Nanoscale - Polarization Difference Probing: A New Phase Detection Scheme for Laser Voltage Probing - Spray Cooling for Time Resolved Emission Measurements of ICs - A Novel Technique for Detecting High Resistance Fault Using Electroplating - Magnetic Current Imaging...
Materials Park, Ohio: ASM International, 2004
e20442635
eBooks  Universitas Indonesia Library