::  Hasil Pencarian  ::  Simpan CSV :: Kembali

Villanucci, Robert S., author

Englewood Cliffs, NJ: Prentice-Hall, 1982

621.381 5 VIL e

Buku Teks  Universitas Indonesia Library

• Cari yang mirip
• Tambahkan ke Favorit

Boylestad, Robert L., author

Electronic Devices and Circuit Theory, Eleventh Edition, offers a complete, comprehensive survey, focusing on all the essentials you will need to succeed on the job. Setting the standard for nearly 30 years, this highly accurate text is supported by strong pedagogy and content that is ideal for new students of...

Upper Saddle River, N.J: Pearson Prentice Hall, 2013

621.381 5 BOY e

Buku Teks  Universitas Indonesia Library

• Cari yang mirip
• Tambahkan ke Favorit
• Abstrak

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and...

Materials Park, Ohio: ASM International, 2010

e20451716

eBooks  Universitas Indonesia Library

• Cari yang mirip
• Tambahkan ke Favorit
• Abstrak

Retno Widayati, author

Jasper Jumper is an orthodontic appliance that belongs to fixed functional appliance. This appliance is designed to correct class II malocclusion case, and also further development of Herbst's. Jasper Jumper can be used to move a tooth, a group of teeth, or the entire denture. In addition, this appliance can...

Jakarta: Journal of Dentistry Indonesia, 2004

AJ-Pdf

Artikel Jurnal  Universitas Indonesia Library

• Cari yang mirip
• Tambahkan ke Favorit
• Abstrak

New York: McGraw-Hill, 1976

643.6 SMA

Buku Teks  Universitas Indonesia Library

• Cari yang mirip
• Tambahkan ke Favorit

Schwarz, A.F.

London: Academic Press, 1987

621.381 SCH c II

Buku Teks  Universitas Indonesia Library

• Cari yang mirip
• Tambahkan ke Favorit

Villanucci, Robert S., author

Englewood Cliffs, NJ: Prentice-Hall, 1981

621.381 VIL e

Buku Teks  Universitas Indonesia Library

• Cari yang mirip
• Tambahkan ke Favorit

Contents : - A Comparitive Study of Electron and Ion Beam Induced Charge Imaging Techniques in CMOS Failure Analysis - Infrared Light Emission From Semiconductor Devices - The Use of Near-Field Scanning Optical Microscopy for Failure Analysis of ULSI Circuits -...

Materials Park, Ohio: ASM International, 1996

e20442490

eBooks  Universitas Indonesia Library

• Cari yang mirip
• Tambahkan ke Favorit
• Abstrak

In this paper we present a new method to increase the lateral resolution available in laser scanning failure analysis tools. By fabricating a diffractive lens on the back side of the die, the area of the circuit of interest, directly underneath the lens, may be studied with a lateral resolution...

Materials Park, Ohio: ASM International, 2005

e20442491

eBooks  Universitas Indonesia Library

• Cari yang mirip
• Tambahkan ke Favorit
• Abstrak

Morgan, David, author

This major reference book is aimed at engineers and technical managers concerned with EMC (electromagnetic compatibility). It explains why EMC testing is necessary, what standards must be met, how such testing is carried out (and therefore how to prepare for it), what accuracy and repeatability can be expected, and when...

London: International Engineering Consortium, 2007

e20452027

eBooks  Universitas Indonesia Library

• Cari yang mirip
• Tambahkan ke Favorit
• Abstrak