Mrozek, Ireneusz
Multi-run Memory Tests for Pattern Sensitive Faults
Springer Cham, 2019
 eBooks
City of bits
 Buku Teks
Computational Photonic Sensors
Springer Cham, 2019
 eBooks
IEEE transactions on power electronics
The Institute of Electrical and Electronics Engineers, 2008
 Majalah, Jurnal, Buletin
IEEE Transactions on Power Delivery
The Institute of Electrical and Electronics Engineers, 2008
 Majalah, Jurnal, Buletin