Ditemukan 150 dokumen yang sesuai dengan query
Contents
- IPFA 2000 Best Paper Award Winner
- Application of Focused Ion Beam System as a Defect Localization and Root
Cause Analysis Tool
- Session 1: Advanced Techniques 1
- X-Ray Tomography of Integrated Circuit Interconnects: Past and Future
- X-ray Nanotomog...
Materials Park, Ohio: ASM International, 2001
e20442603
eBooks Universitas Indonesia Library
This proceedings volume contains 101 papers from an October 2002 meeting, detailing advances in case hardening processes, corrosion protection and tribological coatings, laser processes, characterization, modeling, quenching, nano-materials, thermal spray, residual stress, and manufacturing equipmen...
Materials Park, Ohio: ASM International, 2003
e20442616
eBooks Universitas Indonesia Library
Contents :
- Foreword
- The Microelectronics Desk Reference
- System Level Failure Analysis Process: Making Failure Analysis a Value Add
Proposition in today’s High Speed Low Cost PC environment
- Board Level Failure Mechanisms and Analysis in Hand-held Electronic Products
- Failure Analysis...
Materials Park, Ohio: ASM International, 2004
e20442620
eBooks Universitas Indonesia Library
Contents :
- IPFA 2002 Best Paper Award Winner
- SEM/SThM-Hybrid-System: A New Tool for Advanced Thermal Analysis of
Electronic Devices
- From Microns to Molecules–Can FA Remain Viable Through the Next Decade?
- Soft Defect Localization (SDL) on ICs
- Fault Localization and Functional...
Materials Park, Ohio: ASM International, 2002
e20442621
eBooks Universitas Indonesia Library
Contents :
- Quo Vadis Thermal Spraying ?
- HVOF-Sprayed Quasicrystal Composite Coatings for Bearing Applications
- Functional Ceramic and Metallurgical Coatings on Magnesium Components
- Study on Zircon-Based Ceramic Coating for High Temperature Oxidation
Resistant Application
- Tungsten Coatings for Divertor Wings...
Materials Park, Ohio: ASM International, 2001
e20442629
eBooks Universitas Indonesia Library
Contents :
- Session 1: Advanced Techniques
- Scanning Magnetoresistive Microscopy for Die-Level Sub-Micron Current Density
Mapping
- High Resolution Current Imaging by Direct Magnetic Field Sensing
- Fault Isolation of High Resistance Defects using Comparative Magnetic Field
Imaging
- High Resolution Backside...
Materials Park, Ohio: ASM International, 2003
e20442631
eBooks Universitas Indonesia Library
Contents :
- Microscopy at the Nanoscale
- Polarization Difference Probing: A New Phase Detection Scheme for Laser
Voltage Probing
- Spray Cooling for Time Resolved Emission Measurements of ICs
- A Novel Technique for Detecting High Resistance Fault Using Electroplating
- Magnetic Current Imaging...
Materials Park, Ohio: ASM International, 2004
e20442635
eBooks Universitas Indonesia Library
Kaufman, J. Gilbert, author
Contents :
- Chapter 1: Introduction
- Chapter 2: Aluminum casting alloys
- Chapter 3: Aluminum casting processes
- Chapter 4: The effects of microstructure on properties
- Chapter 5: The influence and control of porosity and inclusions in aluminum
Castings
-...
Materials Park, Ohio: ASM International, 2004
e20442643
eBooks Universitas Indonesia Library
Warmuzek, Malgorzata, author
This atlas provides an in-depth understanding of the metallurgy and fracture behavior of aluminum-silicon casting alloys, which are used in a wide variety of automotive, aerospace, and consumer product applications. The atlas includes over 300 high-definition microfractographs of fracture profiles and fracture surfaces, accompanied with detailed descriptions and analysis of...
Materials Park, Ohio: ASM International, 2004
e20442648
eBooks Universitas Indonesia Library
Schwartz, Mel M., author
Text provides information needed to braze materials that will be used in the 21st century. Revised to include lessons learned on tooling, design, materials, atmospheres, processing, and equipment. For brazing technologists and engineers....
Materials Park, Ohio: ASM International, 2003
e20442658
eBooks Universitas Indonesia Library
