Ditemukan 17 dokumen yang sesuai dengan query
Contents :
- IPFA 2002 Best Paper Award Winner
- SEM/SThM-Hybrid-System: A New Tool for Advanced Thermal Analysis of
Electronic Devices
- From Microns to Molecules–Can FA Remain Viable Through the Next Decade?
- Soft Defect Localization (SDL) on ICs
- Fault Localization and Functional...
Materials Park, Ohio: ASM International, 2002
e20442621
eBooks Universitas Indonesia Library
Contents :
- Session 1: Advanced Techniques
- Scanning Magnetoresistive Microscopy for Die-Level Sub-Micron Current Density
Mapping
- High Resolution Current Imaging by Direct Magnetic Field Sensing
- Fault Isolation of High Resistance Defects using Comparative Magnetic Field
Imaging
- High Resolution Backside...
Materials Park, Ohio: ASM International, 2003
e20442631
eBooks Universitas Indonesia Library
Contents :
- Microscopy at the Nanoscale
- Polarization Difference Probing: A New Phase Detection Scheme for Laser
Voltage Probing
- Spray Cooling for Time Resolved Emission Measurements of ICs
- A Novel Technique for Detecting High Resistance Fault Using Electroplating
- Magnetic Current Imaging...
Materials Park, Ohio: ASM International, 2004
e20442635
eBooks Universitas Indonesia Library
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand and eliminate electronic device and system failures...
Materials Park, Ohio: ASM International, 2006
e20451852
eBooks Universitas Indonesia Library
Shina, Sammy G.,
New York : McGraw-Hill, 2002
621.381 SHI s
Buku Teks Universitas Indonesia Library
Contents :
- Laser Voltage Probe (LVP): A Novel Optical Probing Technology for Flip-Chip
Packaged Microprocessors
- Scanning Electron Acoustic Microscopy: A Novel Tool for Failure Analysis &
Microcharacterisation
- Application of Single Contact Optical Beam Induced Currents (SCOBIC) for
Backside Failure Analysis...
Materials Park, Ohio: AsM International, 2000
e20442548
eBooks Universitas Indonesia Library
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and...
Materials Park, Ohio: ASM International, 2008
e20442550
eBooks Universitas Indonesia Library
