Ditemukan 1 dokumen yang sesuai dengan query
Farid Wadjdi Machmud, author
A computerized interference pattern analysis has been developed for analyzing an interference pattern produced by the Tolansky interferometric arrangement. The purpose of the analysis is to obtain informations about the thickness of thin films deposited on smooth non-planar substrate. An approximation scheme employing the combination of Taylor expansion and Binomial...
Depok: Fakultas Teknik Universitas Indonesia, 1986
T-Pdf
UI - Tesis Membership Universitas Indonesia Library
