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Hasil Pencarian

Ditemukan 17 dokumen yang sesuai dengan query
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Villanucci, Robert S., author
Englewood Cliffs, NJ: Prentice-Hall, 1982
621.381 5 VIL e
Buku Teks  Universitas Indonesia Library
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This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and...
Materials Park, Ohio: ASM International, 2010
e20451716
eBooks  Universitas Indonesia Library
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Villanucci, Robert S., author
Englewood Cliffs, NJ: Prentice-Hall, 1981
621.381 VIL e
Buku Teks  Universitas Indonesia Library
cover
Contents : - A Comparitive Study of Electron and Ion Beam Induced Charge Imaging Techniques in CMOS Failure Analysis - Infrared Light Emission From Semiconductor Devices - The Use of Near-Field Scanning Optical Microscopy for Failure Analysis of ULSI Circuits -...
Materials Park, Ohio: ASM International, 1996
e20442490
eBooks  Universitas Indonesia Library
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In this paper we present a new method to increase the lateral resolution available in laser scanning failure analysis tools. By fabricating a diffractive lens on the back side of the die, the area of the circuit of interest, directly underneath the lens, may be studied with a lateral resolution...
Materials Park, Ohio: ASM International, 2005
e20442491
eBooks  Universitas Indonesia Library
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Morgan, David, author
This major reference book is aimed at engineers and technical managers concerned with EMC (electromagnetic compatibility). It explains why EMC testing is necessary, what standards must be met, how such testing is carried out (and therefore how to prepare for it), what accuracy and repeatability can be expected, and when...
London: International Engineering Consortium, 2007
e20452027
eBooks  Universitas Indonesia Library
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Contents : - Foreword - The Microelectronics Desk Reference - System Level Failure Analysis Process: Making Failure Analysis a Value Add Proposition in today’s High Speed Low Cost PC environment - Board Level Failure Mechanisms and Analysis in Hand-held Electronic Products - Failure Analysis Flow...
Materials Park, Ohio: ASM International, 2004
e20442591
eBooks  Universitas Indonesia Library
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Contents : - Microelectronics failure analysis desk reference, 2001 supplement - Preface - Microelectronic Failure Analysis Desk Reference 2001 Supplement - FIB Backside Isolation Techniques - The SEM Lab, From Laboratory Logistics to Final Sample Preparation Techniques for SEM Analysis of Semiconductors - Cross...
Materials Park, Ohio: ASM International, 2001
e20442592
eBooks  Universitas Indonesia Library
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Contents - IPFA 2000 Best Paper Award Winner - Application of Focused Ion Beam System as a Defect Localization and Root Cause Analysis Tool - Session 1: Advanced Techniques 1 - X-Ray Tomography of Integrated Circuit Interconnects: Past and Future - X-ray Nanotomog...
Materials Park, Ohio: ASM International, 2001
e20442603
eBooks  Universitas Indonesia Library
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Contents : - Foreword - The Microelectronics Desk Reference - System Level Failure Analysis Process: Making Failure Analysis a Value Add Proposition in today’s High Speed Low Cost PC environment - Board Level Failure Mechanisms and Analysis in Hand-held Electronic Products - Failure Analysis...
Materials Park, Ohio: ASM International, 2004
e20442620
eBooks  Universitas Indonesia Library
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