Ditemukan 1 dokumen yang sesuai dengan query
Mrozek, Ireneusz, author
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions...
Switzerland: Springer Cham, 2019
e20501719
eBooks Universitas Indonesia Library
