Ditemukan 234 dokumen yang sesuai dengan query
Tehranipoor, Mohammad, author
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including...
New York: Springer, 2011
e20410831
eBooks Universitas Indonesia Library
Murarka, S.P.
New York: Academic Press, 1983
621.381 MUR s
Buku Teks Universitas Indonesia Library
Millman, Jacob, author
London: McGraw-Hill, 1979
621.381 MIL m
Buku Teks Universitas Indonesia Library
Stanley, William D., author
New york: Merrill Pub. Co,, 1994
621.381 STA o
Buku Teks Universitas Indonesia Library
Hollis, Ernest E.
Englewood Cliffs, NJ: Prentice-Hall, 1987
621.395 HOL d
Buku Teks Universitas Indonesia Library
New York: IEEE Press, 1985
621.395 VLS
Buku Teks Universitas Indonesia Library
Reading Mass.: Addison-Wesley, 1988
621.395 SIL
Buku Teks Universitas Indonesia Library
Sherwani, Naveed
Dordrecht, The Netherland: Kluwer Academic Publishers, 1996
621.395 SHE a
Buku Teks Universitas Indonesia Library
Elliott, David J., author
New York: McGraw-Hill, 1986
621.381 73 ELL m
Buku Teks Universitas Indonesia Library
McKay, Charles W.
Englewood Cliffs: Prentice-Hall, 1981
621.381 9 MCK e
Buku Teks Universitas Indonesia Library
