Hasil Pencarian

Ditemukan 348 dokumen yang sesuai dengan query

Wobschall, Darold, author

Circuit design for electronic instrumentation analog and digital devices from sensor to display

New York: McGraw-Hill, 1987

621.381 53 WOB c

Buku Teks Universitas Indonesia Library

Dwi Retno Lestari, author

Telaah atas laporan keuangan perusahaan-perusahan yang go publik pada industri elektronika, kabel dan kawat tembaga untuk tahun 1989, 1990 dan 1991

Depok: Fakultas Ekonomi dan Bisnis Universitas Indonesia, 1996

S19068

UI - Skripsi (Membership) Universitas Indonesia Library

Hope, G.S.

Integrated devices in digital circuit design / G. S. Hope

New York: Wiley , 1981

621.381 HOP i (1)

Buku Teks Universitas Indonesia Library

McGraw-Hill Dictionary of electrical and electronic engineering

Buku yang berjudul "McGraw-Hill Dictionary of electrical and electronic engineering" ini merupakan sebuah kamus mengenai istilah-istilah dalam bidang teknik elektrik...

New York: McGraw-Hill, 1984

R 621.30321 MCG

Buku Referensi Universitas Indonesia Library

Lee, Samuel C., author

Rangkaian digital dan rancangan logik

Jakarta: Erlangga, 2005

621.381 958 LEE dt (1)

Buku Teks Universitas Indonesia Library

Kaufman, Milton

Handbook of electronics calculations for engineers and technicians

New York: McGraw-Hill, 1988

R 621.389 HAN

Buku Referensi Universitas Indonesia Library

Polyakov, G.,

Industrial wiring : manual for traines electricians/ G.Polyakov

Moscow: Progress Publishing, {s.a}

621.381 POL i

Buku Teks Universitas Indonesia Library

ISTFA '97: proceedings of the 23rd International Symposium for Testing and Failure Analysis, 27-31 October 1997, Santa Clara Convention Center, Santa Clara, California

Contents : - Testing-Based Failure Analysis: A Critical Component of the SIA Roadmap Vision - Experimental Figures for the Defect Coverage of IDDQVectors - A CAD-Based Approach to Failure Diagnosis of CMOSLSI with Single Fault Using Abnormal IDDQ - Test and Failure Analysis Implications of a Novel...

Materials Park, Ohio: ASM International, 1997

e20442506

eBooks Universitas Indonesia Library

ISTFA '98: proceedings of the 24th International Symposium for Testing and Failure Analysis, 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas

Contents : - Keynote Presentation - Breakup Sequence of the TWA Flight 800 Airplane: How it was Determined That an Explosion of the Wing Center Section Fuel Tank Initiated the Breakup - Session 1: Advanced Techniques - Micro-Raman Spectroscopy Evaluation of the Local Mechanical Stress in...

Materials Park, Ohio: ASM International, 1998

e20442507

eBooks Universitas Indonesia Library

ISTFA '99: proceedings of the 25th international symposium for testing and failure analysis, 14-18 November 1999, Westin Hotel Santa Clara, California

Contents : - Terahertz Imaging: A New Technique for Inspection of Dielectric Materials - Detecting Power Shorts from Front and Backside of IC Packages Using Scanning SQUID Microscopy - Waveform Acquisition from the Backside of Silicon Using Electro-Optic Probing - Optical Probing of VLSI IC’s from the...

Materials Park, Ohio: ASM International, 1999

e20442508

eBooks Universitas Indonesia Library

<< 21 22 23 24 25 26 27 28 29 30 >>

:: Hasil Pencarian :: Simpan CSV :: Kembali

Hasil Pencarian