Ditemukan 30 dokumen yang sesuai dengan query
Millman, Jacob, author
Jakarta: Erlangga, 1986
621.381 MIL i
Buku Teks Universitas Indonesia Library
Millman, Jacob, author
Jakarta: Erlangga, 1985
621.381 MIL i
Buku Teks Universitas Indonesia Library
Millman, Jacob, author
Jakarta: Erlangga, 1993
621.381 MIL e
Buku Teks Universitas Indonesia Library
Millman, Jacob, author
Jakarta: Erlangga, 1997
621.381 MIL i
Buku Teks Universitas Indonesia Library
Bou-Sleiman, Sleiman, author
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result...
New York: [Springer, ], 2012
e20397989
eBooks Universitas Indonesia Library
Millman, Jacob, author
Jakarta: Erlangga, 1993
621.381 MIL e
Buku Teks Universitas Indonesia Library
Millman, Jacob, author
Jakarta: Erlangga, 1984
621.381 MIL e
Buku Teks Universitas Indonesia Library
Onabajo, Marvin, author
This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune...
New York: [Springer, ], 2012
e20418288
eBooks Universitas Indonesia Library
This book contains extended and revised versions of the best papers presented at the 18th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2010, held in Madrid, Spain, in September 2010. The 14 papers included in the book were carefully reviewed and selected from the 52 full...
Heidelberg: Springer-Verlag, 2012
e20410266
eBooks Universitas Indonesia Library
Eggersgluß, Stephan, author
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay...
New York: [, Springer], 2012
e20418663
eBooks Universitas Indonesia Library
