Ditemukan 1 dokumen yang sesuai dengan query
Jayanthy, S., author
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test...
Singapore: Springer Singapore, 2019
e20502693
eBooks Universitas Indonesia Library
