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"This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects."

"Telah dibuat high contrast resolution test tool yang mempunyai range frekuensi spasial dari 0,5 - 1,67 lp/mm dan telah dilakukan pengujian yang bertujuan untuk memonitor sistem fluoroskopi Shimadzhu Multi Purpose UDT-ISO dan Siemens Axiom Iconos R100 General Multi Purpose. Batas resolusi untuk pesawat Shimadzhu < 0,5 lp/mm dan untuk pesawat Siemens adalah 1 lp/mm untuk mode Field of View (FoV) 19 cm dan 1,25 lp/mm untuk mode FoV 15 cm maupun 12 cm. Batas resolusi pada pesawat Shimadzhu yang diperoleh dari penelitian ini sudah tidak sesuai dengan ketentuan yang direkomendasikan, namun pada pesawat Siemens masih sesuai dengan ketentuan yang direkomendasikan. Kualitas test tool buatan sendiri kurang baik pada nilai lp/mm yang besar dibandingkan test tool komersial.

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High contrast resolution test tool range has been made in spatial frequency from 0,5 - 1,67 lp/mm and tested on fluoroscopy machines Shimadzhu Multi Purpose UDT-ISO and Siemens Axiom Iconos R100 General Multi Purpose as a part of quality control. Resolution was measured as < 0,5 lp/mm for fluoroscopy machine Shimadzhu and 1 lp/mm with a 19 cm FOV and 1,25 lp/mm with 15 cm or 12 cm FoV for Siemens machine. Thus, the fluoroscopy machine Siemens is still in good condition and proper to be used for clinical examination. The home built test tool performed poorly in higher lp/mm range but otherwise comparable to the commercial one."

"This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing."

"The new edition of this book incorporates the recent remarkable changes in electric power generation, transmission and distribution. The consequences of the latest development to High Voltage (HV) test and measuring techniques result in new chapters on Partial Discharge measurements, Measurements of Dielectric Properties, and some new thoughts on the Shannon Theorem and Impuls current measurements.This standard reference of the international high-voltage community combines high voltage engineering with HV testing techniques and HV measuring methods. Based on long-term experience gained by the authors the book reflects the state of the art as well as the future trends in testing and diagnostics of HV equipment. It ensures a reliable generation, transmission and distribution of electrical energy. The book is intended not only for experts but also for students in electrical engineering and high-voltage engineering."

"Sheaves of algebras over boolean spaces comprehensively covers sheaf theory as applied to universal algebra. The text presents intuitive ideas from topology such as the notion of metric space and the concept of central idempotent from ring theory. These lead to the abstract notions of complex and factor element, respectively. Factor elements are defined by identities, discovered for shells for the first time, explaining why central elements in rings and lattices have their particular form. Categorical formulations of the many representations by sheaves begin with adjunctions and move to equivalences as the book progresses, generalizing stone’s theorem for boolean algebras."

"Boolean circuit complexity is the combinatorics of computer science and involves many intriguing problems that are easy to state and explain, even for the layman. This book is a comprehensive description of basic lower bound arguments, covering many of the gems of this “complexity Waterloo” that have been discovered over the past several decades, right up to results from the last year or two. Many open problems, marked as Research Problems, are mentioned along the way. The problems are mainly of combinatorial flavor but their solutions could have great consequences in circuit complexity and computer science. "

"ABSTRAK Telah dibuat high contrast resolution test tool yang mempunyai range frekuensi spasial dari 0,5 ? 1,67 lp/mm dan telah dilakukan pengujian yang bertujuan untuk memonitor sistem fluoroskopi Shimadzhu Multi Purpose UDT-ISO dan Siemens Axiom Iconos R100 General Multi Purpose. Batas resolusi untuk pesawat Shimadzhu < 0,5 lp/mm dan untuk pesawat Siemens adalah 1 lp/mm untuk mode Field of View (FoV) 19 cm dan 1,25 lp/mm untuk mode FoV 15 cm maupun 12 cm. Batas resolusi pada pesawat Shimadzhu yang diperoleh dari penelitian ini sudah tidak sesuai dengan ketentuan yang direkomendasikan, namun pada pesawat Siemens masih sesuai dengan ketentuan yang direkomendasikan. Kualitas test tool buatan sendiri kurang baik pada nilai lp/mm yang besar dibandingkan test tool komersial. Kata kunci : Fluoroskopi, resolusi, quality control ABSTRACT High contrast resolution test tool range has been made in spatial frequency from 0,5 ? 1,67 lp/mm and tested on fluoroscopy machines Shimadzhu Multi Purpose UDT-ISO and Siemens Axiom Iconos R100 General Multi Purpose as a part of quality control. Resolution was measured as < 0,5 lp/mm for fluoroscopy machine Shimadzhu and 1 lp/mm with a 19 cm FOV and 1,25 lp/mm with 15 cm or 12 cm FoV for Siemens machine. Thus, the fluoroscopy machine Siemens is still in good condition and proper to be used for clinical examination. The home built test tool performed poorly in higher lp/mm range but otherwise comparable to the commercial one. Key words : Fluoroscopy, resolution, quality control (Skripsi S1, xi +31 hlm., 24 Gambar, 1 Tabel, Tahun 2006)"