Ditemukan 2 dokumen yang sesuai dengan query
Tehranipoor, Mohammad, author
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including...
New York: Springer, 2011
e20410831
eBooks Universitas Indonesia Library
Jayanthy, S., author
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test...
Singapore: Springer Singapore, 2019
e20502693
eBooks Universitas Indonesia Library
